검색결과 : 1건
No. | Article |
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1 |
Evaluation of Ti-Si-N as a diffusion barrier between copper and silicon No JT, O JH, Lee C Materials Chemistry and Physics, 63(1), 44, 2000 |
No. | Article |
---|---|
1 |
Evaluation of Ti-Si-N as a diffusion barrier between copper and silicon No JT, O JH, Lee C Materials Chemistry and Physics, 63(1), 44, 2000 |