검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Ellipsometric analysis of ultrathin oxide layers on SIMOX wafers Motooka T, Kusano Y, Nisihira K, Kato N Applied Surface Science, 159, 111, 2000 |
| No. | Article |
|---|---|
| 1 |
Ellipsometric analysis of ultrathin oxide layers on SIMOX wafers Motooka T, Kusano Y, Nisihira K, Kato N Applied Surface Science, 159, 111, 2000 |