검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Nanoscale Origin of Defects at Metal/Molecule Engineered Interfaces Nirmalraj PN, Schmid H, Gotsmann B, Riel H Langmuir, 29(5), 1340, 2013 |
| 2 |
Effect of sample bias on backscattered ion spectroscopy in the helium ion microscope Behan G, Feng JF, Zhang HZ, Nirmalraj PN, Boland JJ Journal of Vacuum Science & Technology A, 28(6), 1377, 2010 |