화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 Modeled optical properties of SiGe and Si layers compared to spectroscopic ellipsometry measurements
Kriso C, Triozon F, Delerue C, Schneider L, Abbate F, Nolot E, Rideau D, Niquet YM, Mugny G, Tavernier C
Solid-State Electronics, 129, 93, 2017
2 Strain effect on mobility in nanowire MOSFETs down to 10 nm width: Geometrical effects and piezoresistive model
Pelloux-Prayer J, Casse M, Triozon F, Barraud S, Niquet YM, Rouviere JL, Faynot O, Reimbold G
Solid-State Electronics, 125, 175, 2016
3 Study of the light emission in Ge layers and strained membranes on Si substrates
Gassenq A, Guilloy K, Pauc N, Hartmann JM, Dias GO, Rouchon D, Tardif S, Escalante J, Duchemin I, Niquet YM, Chelnokov A, Reboud V, Calvo V
Thin Solid Films, 613, 64, 2016
4 Multiscale simulation of carbon nanotube transistors
Maneux C, Fregonese S, Zimmer T, Retailleau S, Nguyen HN, Querlioz D, Bournel A, Dollfus P, Triozon F, Niquet YM, Roche S
Solid-State Electronics, 89, 26, 2013
5 On the validity of the effective mass approximation and the Luttinger k.p model in fully depleted SOI MOSFETs
Rideau D, Feraille M, Michaillat M, Niquet YM, Tavernier C, Jaouen H
Solid-State Electronics, 53(4), 452, 2009
6 Asymptotic behavior of the exchange-correlation potentials from the linear-response Sham-Schluter equation
Niquet YM, Fuchs M, Gonze X
Journal of Chemical Physics, 118(21), 9504, 2003