검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
SIMS quantitative depth profiling of matrix elements in semiconductor layers Guryanov G, Clair TPS, Bhat R, Caneau C, Nikishin S, Borisov B, Budrevich A Applied Surface Science, 252(19), 7208, 2006 |
| 2 |
Gas source molecular beam epitaxy of high quality AlxGa1-xN (0 <= x <= 1) on Si(111) Nikishin S, Kipshidze G, Kuryatkov V, Choi K, Gherasoiu I, de Peralta LG, Zubrilov A, Tretyakov V, Copeland K, Prokofyeva T, Holtz M, Asomoza R, Kudryavtsev Y, Temkin H Journal of Vacuum Science & Technology B, 19(4), 1409, 2001 |