검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices Nicolett AS, Martino JA, Simoen E, Claeys C Solid-State Electronics, 46(9), 1381, 2002 |
| 2 |
Extraction of the lightly doped drain concentration of fully depleted SOINMOSFETs using the back gate bias effect Nicolett AS, Martino JA, Simoen E, Claeys C Solid-State Electronics, 44(4), 677, 2000 |
| 3 |
Simultaneous extraction of the silicon film and front oxide thicknesses on fully depleted SOI nMOSFETs Nicolett AS, Martino JA, Simoen E, Claeys C Solid-State Electronics, 44(11), 1961, 2000 |