검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Atomic scale study of a MOS structure with an ultra-low energy boron-implanted silicon substrate Duguay S, Ngamo M, Fazzini PF, Cristiano F, Daoud K, Pareige P Thin Solid Films, 518(9), 2398, 2010 |
| 2 |
Characterization of Arsenic segregation at Si/SiO2 interface by 3D atom probe tomography Ngamo M, Duguay S, Pichler P, Daoud K, Pareige P Thin Solid Films, 518(9), 2402, 2010 |