검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Depth profile characterization of electrodeposited multi-thin-film structures by low angle of incidence X-ray diffractometry Nauer M, Ernst K, Kautek W, Neumann-Spallart M Thin Solid Films, 489(1-2), 86, 2005 |
| No. | Article |
|---|---|
| 1 |
Depth profile characterization of electrodeposited multi-thin-film structures by low angle of incidence X-ray diffractometry Nauer M, Ernst K, Kautek W, Neumann-Spallart M Thin Solid Films, 489(1-2), 86, 2005 |