검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Comparison of Submicron Particle Analysis by Auger-Electron Spectroscopy, Time-of-Flight Secondary-Ion Mass-Spectrometry, and Secondary-Electron Microscopy with Energy-Dispersive X-Ray Spectroscopy Childs KD, Narum D, Lavanier LA, Lindley PM, Schueler BW, Mulholland G, Diebold AC Journal of Vacuum Science & Technology A, 14(4), 2392, 1996 |