| 1 |
Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode
Lapshin RV
Applied Surface Science, 470, 1122, 2019 |
| 2 |
Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode
Lapshin RV
Applied Surface Science, 378, 530, 2016 |
| 3 |
Nondestructive analysis of lithographic patterns with natural line edge roughness from Mueller matrix ellipsometric data
Chen XG, Shi YT, Jiang H, Zhang CW, Liu SY
Applied Surface Science, 388, 524, 2016 |
| 4 |
Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description
Lapshin RV
Applied Surface Science, 359, 629, 2015 |
| 5 |
Noise-Assisted Crystallization of Opal Films
Khunsin W, Amann A, Kocher-Oberlehner G, Romanov SG, Pullteap S, Seat HC, O'Reilly EP, Zentel R, Torres CMS
Advanced Functional Materials, 22(9), 1812, 2012 |
| 6 |
Nanometrology - Nanopositioning- and nanomeasuring machine with integrated nanoprobes
Jager G, Hausotte T, Manske E, Buchner H, Mastylo R, Dorozhovets N, Fussl R, Grunwald R
Materials Science Forum, 505-507, 7, 2006 |
