검색결과 : 3건
No. | Article |
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1 |
Electron mobility extraction in triangular gate-all-around Si nanowire junctionless nMOSFETs with cross-section down to 5 nm Najmzadeh M, Berthome M, Sallese JM, Grabinski W, Ionescu AM Solid-State Electronics, 98, 55, 2014 |
2 |
Accumulation-mode gate-all-around si nanowire nMOSFETs with sub-5 nm cross-section and high uniaxial tensile strain Najmzadeh M, Bouvet D, Grabinski W, Sallese JM, Ionescu AM Solid-State Electronics, 74, 114, 2012 |
3 |
Asymmetrically strained all-silicon multi-gate n-Tunnel FETs Najmzadeh M, Boucart K, Riess W, Ionescu AM Solid-State Electronics, 54(9), 935, 2010 |