검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Profiling of deep traps in silicon oxide-nitride-oxide structures Naich M, Rosenman G, Roizin Y Thin Solid Films, 471(1-2), 166, 2005 |
| 2 |
Exoelectron emission studies of trap spectrum in ultrathin amorphous Si3N4 films Naich M, Rosenman G, Roizin Y, Molotskii M Solid-State Electronics, 48(3), 477, 2004 |