검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Time-of-flight secondary ion mass spectrometry depth profiling of multiple quantum well II-VI semiconductors using negative cluster ions Zhao J, Na MH, McKeown PJ, Chang HC, Lee EH, Luo H, Chen JX, Wood TD, Gardella JA Journal of Vacuum Science & Technology B, 17(1), 224, 1999 |
| 2 |
Surface chemistry of II-VI semiconductor ZnSe studied by time of flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy Zhao J, Na MH, Lee EH, Chang HC, Gardella JA, Luo H Journal of Vacuum Science & Technology B, 16(6), 3048, 1998 |