검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Sub-nanometer resolution XPS depth profiling: Sensing of atoms Szklarczyk M, Macak K, Roberts AJ, Takahashi K, Hutton S, Glaszczka R, Blomfield C Applied Surface Science, 411, 386, 2017 |
| 2 |
High resolution interferometry as a tool for characterization of swelling of weakly charged hydrogels subjected to amphiphile and cyclodextrin exposure Gao M, Gawel K, Stokke BT Journal of Colloid and Interface Science, 390, 282, 2013 |
| 3 |
Thermal-induced chemical modification of palladium acetate on the submicrometer scale by in situ scanning thermal microscopy Ng HT, Chew VHT, Loh MFC, Tan KL, Chan L, Li SFY Langmuir, 15(7), 2425, 1999 |