검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
High resolution surface analysis of Si roughening in dilute ammonium fluoride solution Lewerenz HJ, Aggour M, Murrell C, Jakubowicz J, Kanis M, Campbell SA, Cox PA, Hoffmann P, Jungblut H, Schmeisser D Journal of Electroanalytical Chemistry, 540, 3, 2003 |
| 2 |
Initial stages of structure formation on silicon electrodes investigated by photoelectron spectroscopy using synchrotron radiation and in situ atomic force microscopy Lewerenz HJ, Aggour M, Murrell C, Kanis M, Jungblut H, Jakubowicz J, Cox PA, Campbell SA, Hoffmann P, Schmeisser D Journal of the Electrochemical Society, 150(3), E185, 2003 |
| 3 |
Electrochemical interface modification of CuInS2 thin films Aggour M, Storkel U, Murrell C, Campbell SA, Jungblut H, Hoffmann P, Mikalo R, Schmeisser D, Lewerenz HJ Thin Solid Films, 403-404, 57, 2002 |