화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 System optimization of membrane mask distortion correction based on Fourier analysis
Murooka K, Lim MH, Smith HI
Journal of Vacuum Science & Technology B, 22(5), 2309, 2004
2 Initial results of a 50 kV electron beam writer EBM-4000 for a 90 nm node photomask
Murooka K, Hattori K, Iizuka O
Journal of Vacuum Science & Technology B, 21(6), 2668, 2003
3 Membrane mask magnification correction: Alternate technique
Murooka K, Lim MH, Smith HI
Journal of Vacuum Science & Technology B, 20(1), 370, 2002
4 Effect of thermal diffusion on a membrane-mask-distortion correction and compensation method
Murooka K, Lim MH, Smith HI
Journal of Vacuum Science & Technology B, 20(2), 721, 2002
5 Calculational study on membrane mask distortion and correction
Murooka K, Lim MH, Smith HI
Journal of Vacuum Science & Technology B, 19(4), 1229, 2001
6 Membrane-mask distortion correction: Analytical and experimental results
Murooka K, Lim MH, Smith HI
Journal of Vacuum Science & Technology B, 18(6), 2966, 2000