검색결과 : 7건
No. | Article |
---|---|
1 |
Nonlinearities in depth profiling nanometer layers Seah MP, Mulcahy CPA, Biswas S Journal of Vacuum Science & Technology B, 28(6), 1215, 2010 |
2 |
Spectroscopic evaluation of the structural and compositional properties of GaNxAs1-x superlattices grown by molecular beam epitaxy Barker SJ, Williams RS, Mulcahy CPA, Steer MJ, Hopkinson M, Ashwin MJ, Newman RC, Stavrinou PN, Parry G, Jones TS Thin Solid Films, 515(10), 4430, 2007 |
3 |
Ultra low energy SIMS depth profiling of sub-1.5 nm silicon oxynitride films Mulcahy CPA, Bock B, Ebblewhite PA, Hebert HP, Biswas S Applied Surface Science, 252(19), 7198, 2006 |
4 |
RF-plasma source qualification and compositional characterisation of GaNAs superlattices using SIMS Mulcahy CPA, Barker SJ, Williams RS, Hopkinson M, Ashwin M, Stavrinou PN, Parry G, Biswass S, Jones TS Applied Surface Science, 252(19), 7218, 2006 |
5 |
Application of molecular dynamics for low-energy ion implantation in crystalline silicon Chan HY, Srinivasan MP, Montgomery NJ, Mulcahy CPA, Biswas S, Gossmann HJL, Harris M, Nordlund K, Benistant F, Ng CM, Gui D, Chan L Journal of Vacuum Science & Technology B, 24(1), 462, 2006 |
6 |
Molecular dynamics with phase-shift-based electronic stopping for calibration of ion implantation profiles in crystalline silicon Chan HY, Nordlund K, Gossmann HJL, Harris M, Montgomery NJ, Mulcahy CPA, Biswas S, Srinivasan MP, Benistant F, Ng CM, Chan L Thin Solid Films, 504(1-2), 121, 2006 |
7 |
Resonant and nonresonant vibrational and electronic excitations in trimethylaluminum adsorbed on GaAs Mulcahy CPA, Eggeling J, Gould I, Jones TS Journal of Physical Chemistry B, 103(16), 3187, 1999 |