검색결과 : 15건
No. | Article |
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1 |
Combined Experimental and Theoretical Studies on Electron Transfer in Potassium Collisions with CCl4 Regeta K, Kumar S, Cunha T, Mendes M, Lozano AI, Pereira PJS, Garcia G, Moutinho AMC, Bacchus-Montabonel MC, Limao-Vieira P Journal of Physical Chemistry A, 124(16), 3220, 2020 |
2 |
Dynamics of water adsorption on TiO2 monitored by work function spectroscopy Silva AG, Bundaleski N, Moutinho AMC, Teodoro OMND Applied Surface Science, 258(6), 2006, 2012 |
3 |
An upgraded TOF-SIMS VG Ionex IX23LS: Study on the negative secondary ion emission of III-V compound semiconductors with prior neutral cesium deposition Ghumman CAA, Moutinho AMC, Santos A, Teodoro OMND, Tolstogouzov A Applied Surface Science, 258(7), 2490, 2012 |
4 |
Photosensitivity of nanocrystalline ZnO films grown by PLD Ayouchi R, Bentes L, Casteleiro C, Conde O, Marques CP, Alves E, Moutinho AMC, Marques HP, Teodoro O, Schwarz R Applied Surface Science, 255(11), 5917, 2009 |
5 |
Tracking hydroxyl adsorption on TiO2 (110) through secondary emission changes Marques HP, Canario AR, Moutinho AMC, Teodoro OMND Applied Surface Science, 255(16), 7389, 2009 |
6 |
Sub-surface defects induced by low energy Ar(+) sputtering of silver Naia MD, Gordo PM, Teodoro OMND, de Lima AP, Moutinho AMC, Brusa RS Materials Science Forum, 514-516, 1608, 2006 |
7 |
Effect of low level contamination on TiAl alloys studied by SIMS Teodoro OMND, Barbosa J, Naia MD, Moutinho AMC Applied Surface Science, 231-2, 854, 2004 |
8 |
Counterions in poly(allylamine hydrochloride) and poly(styrene sulfonate) layer-by-layer films Lourenco JMC, Ribeiro PA, do Rego AMB, Fernandes FMB, Moutinho AMC, Raposo M Langmuir, 20(19), 8103, 2004 |
9 |
Near-surface studies on low-energy ion irradiated Ni using a positron beam Naia MD, Gordo PM, de Lima AP, Moutinho AMC, Brusa RS Materials Science Forum, 455-456, 623, 2004 |
10 |
Characterization of TiAl alloys by secondary ion mass spectrometry Barbosa J, Teodoro OMND, Moutinho AMC, Ribeiro S, Monteiro C Materials Science Forum, 455-456, 653, 2004 |