검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
High mobility thin film transistors by Nd : YVO4-laser crystallization Helen Y, Dassow R, Nerding M, Mourgues K, Raoult F, Kohler JR, Mohammed-Brahim T, Rogel R, Bonnaud O, Werner JH, Strunk HP Thin Solid Films, 383(1-2), 143, 2001 |
| 2 |
Stability of unhydrogenated polysilicon thin film transistors and structural quality of the channel material Toutah H, Tala-Ighil B, Llibre JF, Rahal A, Mourgues K, Helen Y, Brahim TM, Dassow R, Kohler JR Thin Solid Films, 383(1-2), 299, 2001 |
| 3 |
Grain boundary trap passivation in polysilicon thin film transistor investigated by low frequency noise Mercha A, Pichon L, Carin R, Mourgues K, Bonnaud O Thin Solid Films, 383(1-2), 303, 2001 |
| 4 |
State creation induced by gate bias stress in unhydrogenated polysilicon TFTs Tala-Ighil B, Rahal A, Mourgues K, Toutah A, Pichon L, Mohammed-Brahim T, Raoult F, Bonnaud O Thin Solid Films, 337(1-2), 101, 1999 |
| 5 |
Single shot excimer laser crystallization and LPCVD silicon TFTs Helen Y, Mourgues K, Raoult F, Mohammed-Brahim T, Bonnaud O, Rogel R, Prochasson S, Boher P, Zahorski D Thin Solid Films, 337(1-2), 133, 1999 |
| 6 |
Low-Temperature (Less-Than-or-Equal-to-600 Degrees-C) Unhydrogenated in-Situ Doped Polysilicon Thin-Film Transistors - Towards a Technology for Flat-Panel Displays Pichon L, Raoult F, Mourgues K, Kission K, Mohammedbrahim T, Bonnaud O Thin Solid Films, 296(1-2), 133, 1997 |