화학공학소재연구정보센터
검색결과 : 62건
No. Article
1 Ab Initio Study of the Lowest-Lying Electronic States of LuCl Molecules
Hamade Y, Bazzi H, Sidawi J, Taher F, Monteil Y
Journal of Physical Chemistry A, 116(49), 12123, 2012
2 AES, LEED and PYS investigation of Au deposits on InSe/Si(111) substrate
Abidri B, Ghaffour M, Abdellaoui A, Bouslama M, Hiadsi S, Monteil Y
Applied Surface Science, 256(10), 3007, 2010
3 Investigation by EELS and TRIM simulation method of the interaction of Ar+ and N+ ions with the InP compound
Berrouachedi N, Bouslama M, Abdellaoui A, Ghaffour M, Jardin C, Hamaida K, Monteil Y, Lounis Z, Ouerdane A
Applied Surface Science, 256(1), 21, 2009
4 AES, EELS and TRIM investigation of InSb and InP compounds subjected to Ar+ ions bombardment
Abdellaoui A, Ghaffour M, Ouerdane A, Hamaida K, Monteil Y, Berrouachedi N, Lounis Z, Bouslama M
Applied Surface Science, 254(13), 4024, 2008
5 Study by EELS and EPES of the stability of InPO4/InP system
Ouerdane A, Bouslama M, Ghaffour M, Abdellaoui A, Hamaida K, Lounis Z, Monteil Y, Berrouachedi N, Ouhaibi A
Applied Surface Science, 254(22), 7394, 2008
6 Growth and characterization of BGaAs and BInGaAs epilayers on GaAs by MOVPE
Rodriguez P, Auvray L, Dumont H, Dazord J, Monteil Y
Journal of Crystal Growth, 298, 81, 2007
7 Some aspects on thermodynamic properties, phase diagram and alloy formation in the ternary system BAs-GaAs - Part II: BGaAs alloy formation
Dumont H, Monteil Y
Journal of Crystal Growth, 290(2), 419, 2006
8 Low-temperature homoepitaxial growth of alpha-SiC on on-axis (0001) substrate by vapor-liquid-solid mechanism
Soueidan M, Ferro G, Nsouli B, Cauwet F, Mollet L, Jacquier C, Younes G, Monteil Y
Journal of Crystal Growth, 293(2), 433, 2006
9 Evaluation of p-type doping for (1,1,-2,0) epitaxial layers grown on alpha-cut (1,1,-2,0) 4H-SiC substrates
Blanc C, Zielinski M, Souliere V, Sartel C, Juillaguet S, Contreras S, Camassel J, Monteil Y
Materials Science Forum, 483, 117, 2005
10 Aluminium doping of 4H-SiC grown with HexaMethylDiSilane
Sartel C, Souliere V, Zielinski M, Monteil Y, Camassel J, Rushworth S
Materials Science Forum, 483, 121, 2005