검색결과 : 1건
No. | Article |
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1 |
Characterization of silicon oxynitride films by grazing-emission X-ray fluorescence spectrometry Monaghan ML, Nigam T, Houssa M, De Gendt S, Urbach HP, de Bokx PK Thin Solid Films, 359(2), 197, 2000 |
No. | Article |
---|---|
1 |
Characterization of silicon oxynitride films by grazing-emission X-ray fluorescence spectrometry Monaghan ML, Nigam T, Houssa M, De Gendt S, Urbach HP, de Bokx PK Thin Solid Films, 359(2), 197, 2000 |