화학공학소재연구정보센터
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No. Article
1 A low-complexity 62-GHz f(T) SiGe heterojunction bipolar transistor process using differential epitaxy and in situ phosphorus-doped poly-Si emitter at very low thermal budget
Grahn JV, Fosshaug H, Jargelius M, Jonsson P, Linder M, Malm BG, Mohadjeri B, Pejnefors J, Radamson HH, Sanden M, Wang YB, Landgren G, Ostling M
Solid-State Electronics, 44(3), 549, 2000
2 Ion-induced amorphization and regrowth of C49 and C54 TiSi2
Mohadjeri B, Maex K, Donaton RA, Bender H
Journal of the Electrochemical Society, 146(3), 1122, 1999
3 Oxidation-Enhanced Roughening of Thin Co Films During Sputtering by O-2(+) Ions
Mohadjeri B, Petravic M, Svensson BG
Journal of Vacuum Science & Technology A, 14(4), 2192, 1996
4 Secondary-Ion Mass-Spectrometry Measurements of Shallow Boron Profiles in Cobalt, Silicon, and Cobalt Disilicide
Mohadjeri B, Svensson BG
Journal of Vacuum Science & Technology B, 12(1), 209, 1994