검색결과 : 24건
| No. | Article |
|---|---|
| 1 |
Indirect regulation of temperature in raceway reactors by optimal management of culture depth Rodriguez-Miranda E, Guzman JL, Acien FG, Berenguel M, Visioli A Biotechnology and Bioengineering, 118(3), 1186, 2021 |
| 2 |
A new model to analyze the temperature effect on the microalgae performance at large scale raceway reactors Rodriguez-Miranda E, Acien FG, Guzman JL, Berenguel M, Visioli A Biotechnology and Bioengineering, 118(2), 877, 2021 |
| 3 |
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays Grossi A, Zambelli C, Olivo P, Miranda E, Stikanov V, Walczyk C, Wenger C Solid-State Electronics, 115, 17, 2016 |
| 4 |
Two-stage robust UC including a novel scenario-based uncertainty model for wind power applications Alvarez-Miranda E, Campos-Valdes C, Rahmann C Energy Conversion and Management, 101, 94, 2015 |
| 5 |
Conduction and stability of holmium titanium oxide thin films grown by atomic layer deposition Castan H, Garcia H, Duenas S, Bailon L, Miranda E, Kukli K, Kemell M, Ritala M, Leskela M Thin Solid Films, 591, 55, 2015 |
| 6 |
Three-state resistive switching in HfO2-based RRAM Lian XJ, Miranda E, Long SB, Perniola L, Liu M, Sune J Solid-State Electronics, 98, 38, 2014 |
| 7 |
A Cyclic Peptide Inhibitor of HIF-1 Heterodimerization That Inhibits Hypoxia Signaling in Cancer Cells Miranda E, Nordgren IK, Male AL, Lawrence CE, Hoakwie F, Cuda F, Court W, Fox KR, Townsend PA, Packham GK, Eccles SA, Tavassoli A Journal of the American Chemical Society, 135(28), 10418, 2013 |
| 8 |
Effect of an ultrathin SiO2 interfacial layer on the hysteretic current-voltage characteristics of CeOx-based metal-insulator-metal structures Miranda E, Kano S, Dou C, Sune J, Kakushima K, Iwai H Thin Solid Films, 533, 38, 2013 |
| 9 |
Modeling the breakdown statistics of Al2O3/HfO2 nanolaminates grown by atomic-layer-deposition Conde A, Martinez C, Jimenez D, Miranda E, Rafi JM, Campabadal F, Sune J Solid-State Electronics, 71, 48, 2012 |
| 10 |
Degradation and breakdown characteristics of Al/HfYOx/GaAs capacitors Miranda E, Mahata C, Das T, Sune J, Maiti CK Thin Solid Films, 520(7), 2956, 2012 |