화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 ON-state characteristics of proton irradiated 4H-SiC Schottky diode: The calibration of model parameters for device simulation
Vobecky J, Hazdra P, Zahlava V, Mihaila A, Berthou M
Solid-State Electronics, 94, 32, 2014
2 Performance of SiC Cascode Switches with Si MOS Gate
Brezeanu G, Boianceanu C, Brezeanu M, Mihaila A, Udrea F, Amaratunga G
Materials Science Forum, 483, 825, 2005
3 Evaluation of trench oxide protection techniques on ultra high voltage (10 kV) 4H-SiC UMOSFETs
Rashid SJ, Mihaila A, Udrea F, Malhan RK, Amaratunga G
Materials Science Forum, 457-460, 1441, 2004
4 Towards the fabrication and measurement of high sensitivity SiC-UV detectors with oxide ramp termination
Brezeanu G, Godignon P, Dimitrova E, Raynaud C, Planson D, Mihaila A, Udrea F, Milian J, Amaratunga G, Boianceanu C
Materials Science Forum, 457-460, 1495, 2004
5 A field effect transistor using highly nitrogen-doped CVD diamond for power device applications
Yokoyama Y, Li XQ, Sheng K, Mihaila A, Traikovic T, Udrea F, Amaratunga GAJ, Okano K
Applied Surface Science, 216(1-4), 483, 2003
6 A numerical comparison between MOS control and junction control high voltage devices in SiC technology
Mihaila A, Udrea F, Brezeanu G, Amaratunga G
Solid-State Electronics, 47(4), 607, 2003
7 Static and dynamic behaviour of SiC JFET/Si MOSFET cascade configuration for high-performance power switches
Mihaila A, Udrea F, Azar R, Brezeanu G, Amaratunga G
Materials Science Forum, 389-3, 1239, 2002
8 Silicon/oxide/silicon carbide (SiOSiC) - A new approach for high voltage, high frequencies integrated circuits
Udrea F, Mihaila A, Azar R
Materials Science Forum, 389-3, 1255, 2002
9 An effective high-voltage termination for SiC planar pn junctions for use in high-voltage devices and UV detectors
Brezeanu G, Badila M, Godignon P, Millan J, Udrea F, Mihaila A, Amaratunga G
Materials Science Forum, 389-3, 1301, 2002
10 Novel buried field rings edge termination for 4H-SiC high-voltage devices
Mihaila A, Udrea F, Godignon P, Trajkovic T, Brezeanu G, Rebollo J, Millan J
Materials Science Forum, 433-4, 891, 2002