1 |
Reactive magnetron sputtering of Nb-doped TiO2 films: Relationships between structure, composition and electrical properties Seeger S, Ellmer K, Weise M, Gogova D, Abou-Ras D, Mientus R Thin Solid Films, 605, 44, 2016 |
2 |
Flash-lamp annealing of ZnO-layers on copper-indium-gallium-sulphide layers: A spectroscopic ellipsometry study Reck J, Seeger S, Weise M, Mientus R, Schulte J, Ellmer K Thin Solid Films, 571, 762, 2014 |
3 |
In-situ energy-dispersive X-ray diffraction of metal sulfide assisted crystallization of strongly (001) textured photoactive tungsten disulfide thin films Brunken S, Mientus R, Ellmer K Thin Solid Films, 517(10), 3148, 2009 |
4 |
Carrier transport in polycrystalline transparent conductive oxides: A comparative study of zinc oxide and indium oxide Ellmer K, Mientus R Thin Solid Films, 516(14), 4620, 2008 |
5 |
Carrier transport in polycrystalline ITO and ZnO : Al II: The influence of grain barriers and boundaries Ellmer K, Mientus R Thin Solid Films, 516(17), 5829, 2008 |
6 |
Influence of Discharge Parameters on the Layer Properties of Reactive Magnetron-Sputtered ZnO-Al Films Ellmer K, Kudella F, Mientus R, Schieck R, Fiechter S Thin Solid Films, 247(1), 15, 1994 |