검색결과 : 2건
No. | Article |
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1 |
Stacking disorder in aurivillius compounds studied by X-ray diffraction line profile analysis Boulle A, Legrand C, Thomas P, Guinebretiere R, Mercurio JP, Dauger A Materials Science Forum, 378-3, 753, 2001 |
2 |
X-Ray diffraction line broadening by stacking faults in SrBi2Nb2O9/SrTiO3 epitaxial thin films Boulle A, Legrand C, Guinebretiere R, Mercurio JP, Dauger A Thin Solid Films, 391(1), 42, 2001 |