검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
X-ray diffraction on stacking faults in 3C-SiC epitaxial microcrystals grown on patterned Si(001) wafers Meduna M, Kreiliger T, Mauceri M, Puglisi M, Mancarella F, La Via F, Crippa D, Miglio L, von Kanel H Journal of Crystal Growth, 507, 70, 2019 |
| 2 |
Growth temperature dependent strain in relaxed Ge microcrystals Meduna M, Falub CV, Isa F, von Kanel H Thin Solid Films, 664, 115, 2018 |
| 3 |
Highly Mismatched, Dislocation-Free SiGe/Si Heterostructures Isa F, Salvalaglio M, Dasilva YAR, Meduna M, Barget M, Jung A, Kreiliger T, Isella G, Erni R, Pezzoli F, Bonera E, Niedermann P, Groning P, Montalenti F, von Kanel H Advanced Materials, 28(5), 884, 2016 |
| 4 |
3D heteroepitaxy of mismatched semiconductors on silicon Falub CV, Kreiliger T, Isa F, Taboada AG, Meduna M, Pezzoli F, Bergamaschini R, Marzegalli A, Muller E, Chrastina D, Isella G, Neels A, Niedermann P, Dommann A, Miglio L, von Kanel H Thin Solid Films, 557, 42, 2014 |
| 5 |
Studies of influence of high temperature preannealing on oxygen precipitation in CZ Si wafers Meduna M, Caha O, Bursik J Journal of Crystal Growth, 348(1), 53, 2012 |
| 6 |
The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers - Preliminary results from the second round-robin Matyi RJ, Depero LE, Bontempi E, Colombi P, Gibaud A, Jergel M, Krumrey M, Lafford TA, Lamperti A, Meduna M, Van der Lee A, Wiemer C Thin Solid Films, 516(22), 7962, 2008 |
| 7 |
Structural studies of strain-symmetrised modulation-doped Si/SiGe structures grown by molecular beam epitaxy Falub CV, Meduna M, Muller E, Tsujino S, Borak A, Sigg H, Grutzmacher D, Fromherz T, Bauer G Journal of Crystal Growth, 278(1-4), 495, 2005 |