검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
The role of carrier lifetime in forward bias degradation of 4H-SiC PiN diodes Hefner A, McNutt T, Berning D, Singh R, Akuffo A Materials Science Forum, 457-460, 1053, 2004 |
| 2 |
Compact models for silicon carbide power devices McNutt T, Hefner A, Mantooth A, Berning D, Singh R Solid-State Electronics, 48(10-11), 1757, 2004 |