검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Distinguishing faults from flooding surfaces on spectral gamma-ray logs Ruffell A, McKinley JM, Evans R AAPG Bulletin, 88(9), 1239, 2004 |
| 2 |
Surface metal standards produced by ion implantation through a removable layer Schueler BW, Granger CN, McCaig L, McKinley JM, Metz J, Mowat I, Reich DF, Smith S, Stevie FA, Yang MH Applied Surface Science, 203, 847, 2003 |
| 3 |
High precision measurements of arsenic and phosphorous implantation dose in silicon by secondary ion mass spectrometry Chi PH, Simons DS, McKinley JM, Stevie FA, Granger CN Journal of Vacuum Science & Technology A, 20(3), 688, 2002 |
| 4 |
Analysis of alkali elements in insulators using a CAMECA IMS-6f McKinley JM, Stevie FA, Granger CN, Renard D Journal of Vacuum Science & Technology A, 18(1), 273, 2000 |
| 5 |
Surface quantification by ion implantation through a removable layer Stevie FA, Roberts RF, McKinley JM, Decker MA, Granger CN, Santiesteban R, Hitzman CJ Journal of Vacuum Science & Technology B, 18(1), 483, 2000 |
| 6 |
Depth profiling of ultra-shallow implants using a Cameca IMS-6f McKinley JM, Stevie FA, Neil T, Lee JJ, Wu L, Sieloff D, Granger C Journal of Vacuum Science & Technology B, 18(1), 514, 2000 |