검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
AlGaAsSb superlattice buffer layer for p-channel GaSb quantum well on GaAs substrate Tokranov V, Nagaiah P, Yakimov M, Matyi RJ, Oktyabrsky S Journal of Crystal Growth, 323(1), 35, 2011 |
| 2 |
The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers - Preliminary results from the second round-robin Matyi RJ, Depero LE, Bontempi E, Colombi P, Gibaud A, Jergel M, Krumrey M, Lafford TA, Lamperti A, Meduna M, Van der Lee A, Wiemer C Thin Solid Films, 516(22), 7962, 2008 |
| 3 |
X-ray reflectometry analyses of chromium thin films Matyi RJ, Hatzistergos MS, Lifshin E Thin Solid Films, 515(4), 1286, 2006 |
| 4 |
A high resolution triple axis X-ray diffraction analysis of radiation damage in lysozyme crystals Volz HM, Matyi RJ Journal of Crystal Growth, 232(1-4), 502, 2001 |
| 5 |
Realization and characterization of ultrathin GaAs-on-insulator structures Moran PD, Hansen DM, Matyi RJ, Redwing JM, Kuech TF Journal of the Electrochemical Society, 146(9), 3506, 1999 |
| 6 |
High dose rate effects in silicon by plasma source ion implantation Chun M, Kim B, Conrad JR, Matyi RJ, Malik SM, Fetherston P, Han S Journal of Vacuum Science & Technology B, 17(2), 863, 1999 |
| 7 |
Process effects in shallow junction formation by plasma doping Matyi RJ, Felch SB, Lee BS, Strathman MR, Keenan JA, Guo Y, Wang L Journal of Vacuum Science & Technology B, 16(1), 435, 1998 |
| 8 |
Structural Characterization of Plasma-Doped Silicon by High-Resolution X-Ray-Diffraction Chapek DL, Conrad JR, Matyi RJ, Felch SB Journal of Vacuum Science & Technology B, 12(2), 951, 1994 |