화학공학소재연구정보센터
검색결과 : 21건
No. Article
1 Incentives and stability of international climate coalitions: An integrated assessment
Bosetti V, Carraro C, De Cian E, Masetti E, Tavoni M
Energy Policy, 55, 44, 2013
2 Development and test of a new grating-polarimeter and its application in ellipsometric measurements
Masetti E, Krasilnikova A
Thin Solid Films, 455-56, 138, 2004
3 Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films
Masetti E, Bulir J, Gagliardi S, Janicki V, Krasilnikova A, Di Santo G, Coluzza C
Thin Solid Films, 455-56, 468, 2004
4 "Stapled" bis(phthalocyaninato)niobium(IV), PC2Nb: X-ray crystal structure, chemical and electrochemical behavior, and theoretical studies. Perspectives for the use of PC2Nb (thin films) as an "optically passive electrode" in electrochromic devices
Bauer EM, Donzello MP, Ercolani C, Masetti E, Panero S, Ricciardi G, Rosa A, Chiesi-Villa A, Rizzoli C
Inorganic Chemistry, 42(2), 283, 2003
5 Study of lithium diffusion in RF sputtered nickel-vanadium mixed oxides thin films
Artuso F, Bonino F, Decker F, Lourenco A, Masetti E
Electrochimica Acta, 47(13-14), 2231, 2002
6 Ion assistance effects on electron beam deposited MgF2 films
Alvisi M, De Tomasi F, Della Patria A, Di Giulio M, Masetti E, Perrone MR, Protopapa ML, Tepore A
Journal of Vacuum Science & Technology A, 20(3), 714, 2002
7 Lithium diffusion in cerium-vanadium mixed oxide thin films: a systematic study
Varsano F, Decker F, Masetti E, Croce F
Electrochimica Acta, 46(13-14), 2069, 2001
8 Sputter deposited cerium-vanadium oxide: optical characterization and electrochromic behavior
Masetti E, Varsano F, Decker F, Krasilnikova A
Electrochimica Acta, 46(13-14), 2085, 2001
9 Electrochemical and optical characterization of RF-sputtered thin films of vanadium-nickel mixed oxides
Lourenco A, Masetti E, Decker F
Electrochimica Acta, 46(13-14), 2257, 2001
10 Laser damage studies on MgF2 thin films
Protopapa ML, De Tomasi F, Perrone MR, Piegari A, Masetti E, Ristau D, Quesnel E, Duparre A
Journal of Vacuum Science & Technology A, 19(2), 681, 2001