검색결과 : 44건
| No. | Article |
|---|---|
| 1 |
Experimental analysis and improvement of the DC method for self-heating estimation Mori CAB, Agopian PGD, Martino JA Solid-State Electronics, 159, 171, 2019 |
| 2 |
Study of line-TFET analog performance comparing with other TFET and MOSFET architectures Agopian PGD, Martino JA, Vandooren A, Rooyackers R, Simoen E, Thean A, Claeys C Solid-State Electronics, 128, 43, 2017 |
| 3 |
Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures de Oliveira AV, Agopian PGD, Martino JA, Simoen E, Claeys C, Collaert N, Thean A Solid-State Electronics, 123, 124, 2016 |
| 4 |
Different stress techniques and their efficiency on triple-gate SOI n-MOSFETs Buuhler RT, Agopian PGD, Collaert N, Simoen E, Claeys C, Martino JA Solid-State Electronics, 103, 209, 2015 |
| 5 |
Enhanced dynamic threshold voltage UTBB SOI nMOSFETs Sasaki KRA, Manini MB, Simoen E, Claeys C, Martino JA Solid-State Electronics, 112, 19, 2015 |
| 6 |
Analog performance of vertical nanowire TFETs as a function of temperature and transport mechanism Martino MD, Neves F, Agopian PGD, Martino JA, Vandooren A, Rooyackers R, Simoen E, Thean A, Claeys C Solid-State Electronics, 112, 51, 2015 |
| 7 |
Advantages of different source/drain engineering on scaled UTBOX FDSOI nMOSFETs at high temperature operation Nicoletti T, dos Santos SD, Martino JA, Aoulaiche M, Veloso A, Jurczak M, Simoen E, Claeys C Solid-State Electronics, 91, 53, 2014 |
| 8 |
Threshold voltage extraction in Tunnel FETs Ortiz-Conde A, Garcia-Sanchez FJ, Muci J, Sucre-Gonzalez A, Martino JA, Agopian PGD, Claeys C Solid-State Electronics, 93, 49, 2014 |
| 9 |
Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics dos Santos SD, Cretu B, Strobel V, Routoure JM, Carin R, Martino JA, Aoulaiche M, Jurczak M, Simoen E, Claeys C Solid-State Electronics, 97, 14, 2014 |
| 10 |
Improved retention times in UTBOX nMOSFETs for 1T-DRAM applications Sasaki KRA, Nicoletti T, Almeida LM, dos Santos SD, Nissimoff A, Aoulaiche M, Simoen E, Claeys C, Martino JA Solid-State Electronics, 97, 30, 2014 |