검색결과 : 16건
| No. | Article |
|---|---|
| 1 |
Methods for Gibbs triple junction excess determination: Ti segregation in CoSi2 thin film Zschiesche H, Charai A, Alfonso C, Mangelinck D Journal of Materials Science, 55(27), 13177, 2020 |
| 2 |
Extended defects and precipitation in heavily B-doped silicon Cojocaru-Miredin O, Cristiano F, Fazzini PF, Mangelinck D, Blavette D Thin Solid Films, 534, 62, 2013 |
| 3 |
Combined in situ x-ray scattering and electrical measurements for characterizing phase transformations in nanometric functional films Putero M, Duployer B, Blum I, Ouled-Khachroum T, Coulet MV, Perrin C, Ziegler E, Muller C, Mangelinck D Thin Solid Films, 541, 21, 2013 |
| 4 |
Formation of Pt suicide on doped Si: Kinetics and stress Abbes O, Hoummada K, Mangelinck D, Carron V Thin Solid Films, 542, 174, 2013 |
| 5 |
Al-Cu intermetallic coatings processed by sequential metalorganic chemical vapour deposition and post-deposition annealing Aloui L, Duguet T, Haidara F, Record MC, Samelor D, Senocq F, Mangelinck D, Vahlas C Applied Surface Science, 258(17), 6425, 2012 |
| 6 |
Phase formation of Al10Cu10Fe in thin films Haidara F, Mangelinck D, Duployer B, Record MC Materials Chemistry and Physics, 133(2-3), 977, 2012 |
| 7 |
Interplay between grain boundary grooving, stress, and dealloying in the agglomeration of NiSi1-xGex films Yao HB, Bouville M, Chi DZ, Sun HP, Pan XQ, Srolovitz DJ, Mangelinck D Electrochemical and Solid State Letters, 10(2), H53, 2007 |
| 8 |
Nanoscale effects on interfacial reactions (vol 573, pg 71, 2004) Bergman C, Gas P, Mangelinck D Journal of Electroanalytical Chemistry, 584(1), 23, 2005 |
| 9 |
On the morphological changes of Ni- and Ni(Pt)-silicides Lee PS, Pey KL, Mangelinck D, Chi DZ, Osipowicz T Journal of the Electrochemical Society, 152(4), G305, 2005 |
| 10 |
Nanoscale effects on interfacial reactions Bergman C, Gas P, Mangelinck D Journal of Electroanalytical Chemistry, 573(1), 71, 2004 |