검색결과 : 14건
| No. | Article |
|---|---|
| 1 |
Editorial Selected papers from the 15th Ultimate Integration on Silicon (ULIS) conference Ostling M, Malm BG Solid-State Electronics, 108, 1, 2015 |
| 2 |
Integration of GMR-based spin torque oscillators and CMOS circuitry Chen T, Eklund A, Sani S, Rodriguez S, Malm BG, Akerman J, Rusu A Solid-State Electronics, 111, 91, 2015 |
| 3 |
3D Free-Form Patterning of Silicon by Ion Implantation, Silicon Deposition, and Selective Silicon Etching Fischer AC, Belova LM, Rikers YGM, Malm BG, Radamson HH, Kolahdouz M, Gylfason KB, Stemme G, Niklaus F Advanced Functional Materials, 22(19), 4004, 2012 |
| 4 |
SELECTED PAPERS FROM THE ESSDERC 2011 CONFERENCE Foreword Ostling M, Malm BG Solid-State Electronics, 74, 1, 2012 |
| 5 |
Low-frequency noise in high-k LaLuO3/TiN MOSFETs Olyaei M, Malm BG, Hellstrom PE, Ostling M Solid-State Electronics, 78, 51, 2012 |
| 6 |
PAPERS SELECTED FROM THE 5TH INTERNATIONAL SiGe TECHNOLOGY AND DEVICES MEETING (ISTDM 2010) Foreword Ostling M, Malm BG, Radamson HH Solid-State Electronics, 60(1), 1, 2011 |
| 7 |
Impact of strain and channel orientation on the low-frequency noise performance of Si n- and pMOSFETs von Haartman M, Malm BG, Hellstrom PE, Ostling M, Grasby TJ, Whall TE, Parker EHC, Lyutovich K, Oehme M, Kasper E Solid-State Electronics, 51(5), 771, 2007 |
| 8 |
Low-frequency noise and Coulomb scattering in Si0.8Ge0.2 surface channel pMOSFETs with ALD Al2O3 gate dielectrics von Haartman M, Westlinder J, Wu D, Malm BG, Hellstrom PE, Olsson J, Ostling M Solid-State Electronics, 49(6), 907, 2005 |
| 9 |
Characterization of leakage current related to a selectively grown collector in SiGeC heterojunction bipolar transistor structure Suvar E, Haralson E, Radamson HH, Wang YB, Grahn JV, Malm BG, Ostling M Applied Surface Science, 224(1-4), 336, 2004 |
| 10 |
Low-frequency noise in Si0.7Ge0.3 surface channel pMOSFETs with ALD HfO2/Al2O3 gate dielectrics von Haartman M, Wu D, Malm BG, Hellstrom PE, Zhang SL, Ostling M Solid-State Electronics, 48(12), 2271, 2004 |