검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Comparison of Different Analytical Techniques in Measuring the Surface Region of Ultrashallow Doping Profiles Felch SB, Chapek DL, Malik SM, Maillot P, Ishida E, Magee CW Journal of Vacuum Science & Technology B, 14(1), 336, 1996 |
| 2 |
Silicon-on-Insulator Material Qualification for Low-Power Complementary Metal-Oxide-Semiconductor Application Mendicino MA, Vasudev PK, Maillot P, Hoener C, Baylis J, Bennett J, Boden T, Jackett S, Huffman K, Godwin M Thin Solid Films, 270(1-2), 578, 1995 |