검색결과 : 1건
No. | Article |
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1 |
Application of Raman spectroscopy for depth-dependent evaluation of the hydrogen concentration of amorphous silicon Maurer C, Haas S, Beyer W, Maier FC, Zastrow U, Hulsbeck M, Breuer U, Rau U Thin Solid Films, 653, 223, 2018 |