검색결과 : 11건
No. | Article |
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1 |
Reliability improvement in GaN HEMT power device using a field plate approach Wu WH, Lin YC, Chin PC, Hsu CC, Lee JH, Liu SC, Maa JS, Iwai H, Chang EY, Hsu HT Solid-State Electronics, 133, 64, 2017 |
2 |
The reliability study of III-V solar cell with copper based contacts Hsu CH, Chang EY, Chang HJ, Maa JS, Pande K Solid-State Electronics, 114, 174, 2015 |
3 |
Dislocation reduction in GaN film using Ga-lean GaN buffer layer and migration enhanced epitaxy Wong YY, Chang EY, Wu YH, Hudait MK, Yang TH, Chang JR, Ku JT, Chou WC, Chen CY, Maa JS, Lin YC Thin Solid Films, 519(19), 6208, 2011 |
4 |
Multiplex reverse transcription-polymerase chain reaction combined with on-chip electrophoresis as a rapid screening tool for candidate gene sets Wittig R, Salowsky R, Blaich S, Lyer S, Maa JS, Muller O, Mollenhauer J, Poustka A Electrophoresis, 26(9), 1687, 2005 |
5 |
Effect of temperature on etch rate of iridium and platinum in CF4/O-2 Maa JS, Ying H, Zhang FY Journal of Vacuum Science & Technology A, 19(4), 1312, 2001 |
6 |
Plasma etching of lead germanate (PGO) ferroelectric thin film Ying H, Li TK, Maa JS, Zhang FY, Hsu ST, Gao YF, Engelhard M Journal of Vacuum Science & Technology A, 19(4), 1341, 2001 |
7 |
Effect of interlayer on thermal stability of nickel silicide Maa JS, Ono Y, Tweet DJ, Zhang FY, Hsu ST Journal of Vacuum Science & Technology A, 19(4), 1595, 2001 |
8 |
Selectivity to silicon nitride in chemical vapor deposition of titanium silicide Maa JS, Howard DJ, He SS, Tweet DJ, Stecker L, Stecker G, Hsu ST Journal of Vacuum Science & Technology B, 17(5), 2243, 1999 |
9 |
Selective deposition of TiSi2 on ultra-thin silicon-on-insulator (SOI) wafers Maa JS, Ulrich B, Hsu ST, Stecker G Thin Solid Films, 332(1-2), 412, 1998 |
10 |
Reaction of amorphous Si with cobalt silicide before disilicide formation for reducing Si consumption in SIMOX Maa JS, Hsu ST, Ulrich B, Peng CH Thin Solid Films, 308-309, 570, 1997 |