검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Electrical properties of polycrystalline and single crystalline nickel layer capped ZnO nanowires Mudusu D, Nandanapalli KR, Dugasani SR, Kang JW, Park SH, Tu CW Current Applied Physics, 17(12), 1699, 2017 |
| 2 |
RTN and BTI in nanoscale MOSFETs: A comprehensive statistical simulation study Amoroso SM, Gerrer L, Markov S, Adamu-Lema F, Asenov A Solid-State Electronics, 84, 120, 2013 |
| 3 |
Theoretical analysis of the vertical LOCOS DMOS transistor with process-induced stress enhancement Reggiani S, Denison M, Gnani E, Gnudi A, Baccarani G, Pendharkar S, Wise R Solid-State Electronics, 54(9), 950, 2010 |
| 4 |
Worst-case analysis and statistical simulation of MOSFET devices based on parametric test data Zhang Q, Liou JJ, McMacken J, Thomson JR, Stiles K, Layman P Solid-State Electronics, 45(9), 1537, 2001 |