검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Statistical analysis of tunnel currents in scaled MOS structures with a non-uniform oxide thickness distribution Tyaginov SE, Vexler MI, Shulekin AF, Grekhov IV Solid-State Electronics, 49(7), 1192, 2005 |
| 2 |
Impact of oxide damage on the light emission properties of MOS tunnel structures Asli N, Shulekin AF, Yoder PD, Vexler MI, Grekhov IV, Seegebrecht P Solid-State Electronics, 48(5), 731, 2004 |