검색결과 : 15건
No. | Article |
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1 |
Plasma-Enhanced Atomic Layer Deposition of TaCx Films Using Tris(neopentyl) Tantalum Dichloride and H-2 Plasma Kim TH, Eom TK, Kim SH, Kang DH, Kim H, Yu SH, Lim JM Electrochemical and Solid State Letters, 14(8), D89, 2011 |
2 |
Physicochemical and Electrical Properties of LaLuO3/Ge(100) Structures Submitted to Postdeposition Annealings Radtke C, Krug C, Soares GV, Baumvol IJR, Lopes JMJ, Durgun-Ozben E, Nichau A, Schubert J, Mantl S Electrochemical and Solid State Letters, 13(5), G37, 2010 |
3 |
Low Leakage and High-k Liquid Phase Deposited TiO2 and SiO2/TiO2 Films on (NH4)(2)S-Treated GaAs Lee MK, Yen CF Electrochemical and Solid State Letters, 13(10), G87, 2010 |
4 |
A Nonvolatile Memory Capacitor Based on a Double Gold Nanocrystal Storing Layer and High-k Dielectric Tunneling and Control Layers Mikhelashvili V, Meyler B, Yofis S, Salzman J, Garbrecht M, Cohen-Hyams T, Kaplan WD, Eisenstein G Journal of the Electrochemical Society, 157(4), H463, 2010 |
5 |
Improved Electrical Performance and Thermal Stability of HfO2/Al2O3 Bilayer over HfO2 Gate Dielectric AlGaN/GaN MIS-HFETs Tian F, Chor EF Journal of the Electrochemical Society, 157(5), H557, 2010 |
6 |
Evaluation of emission uniformity of nanocrystalline silicon planar cathodes Shimawaki H, Murakami K, Neo Y, Mimura H, Wakaya F, Takai M Journal of Vacuum Science & Technology B, 28(2), C2C49, 2010 |
7 |
Deuterium Trapping at the Pt/HfO2 Interface Driemeier C, Kanter MM, Miotti L, Soares GV, Baumvol IJR Electrochemical and Solid State Letters, 12(4), G9, 2009 |
8 |
Current Transport Mechanism in High-kappa Cerium Oxide Gate Dielectrics Grown on Germanium Substrates Rahman MS, Evangelou EK, Androulidakis II, Dimoulas A Electrochemical and Solid State Letters, 12(5), H165, 2009 |
9 |
Improvement of the Diffusion Barrier Performance of Ru by Incorporating a WNx Thin Film for Direct-Plateable Cu Interconnects Sari W, Eom TK, Jeon CW, Sohn H, Kim SH Electrochemical and Solid State Letters, 12(7), H248, 2009 |
10 |
Electrical characteristics of thin boron carbonitride films on Ge(100) and Si(100) Fitzpatrick PR, Ekerdt JG Journal of Vacuum Science & Technology B, 27(6), 2366, 2009 |