화학공학소재연구정보센터
검색결과 : 16건
No. Article
1 Evolution of tungsten-oxide whiskers synthesized by a rapid thermal-annealing treatment
Cho MH, Park SA, Yang KD, Lyo IW, Jeong K, Kang SK, Ko DH, Kwon KW, Ku JH, Choi SY, Shin HJ
Journal of Vacuum Science & Technology B, 22(3), 1082, 2004
2 Characteristics of ultrathin SiO2 films using dry rapid thermal oxidation and Pt catalyzed wet oxidation
Cho MH, Shin JS, Roh YS, Lyo IW, Jeong K, Whang CN, Lee JS, Yoo JY, Lee NI, Fujihara K, Moon DW
Journal of Vacuum Science & Technology A, 21(4), 1004, 2003
3 Epitaxial Y2O3 film growth on an oxidized Si surface
Cho MH, Ko DH, Choi YK, Lyo IW, Jeong K, Whang CN
Thin Solid Films, 402(1-2), 38, 2002
4 Structural and electrical characteristics of Y2O3 films grown on oxidized Si(100) surface
Cho MH, Ko DH, Choi YG, Jeong K, Lyo IW, Noh DY, Kim HJ, Whang CN
Journal of Vacuum Science & Technology A, 19(1), 192, 2001
5 Thickness dependence of Y2O3 films grown on an oxidized Si surface
Cho MH, Ko DH, Choi YK, Lyo IW, Jeong K, Whang CN, Kim HJ, Noh DY
Journal of Vacuum Science & Technology A, 19(1), 200, 2001
6 Characteristics of Y2O3 films on Si(111) grown by oxygen-ion beam-assisted deposition
Cho MH, Ko DH, Seo JG, Whangbo SW, Jeong K, Lyo IW, Whang CN, Noh DY, Kim HJ
Thin Solid Films, 382(1-2), 288, 2001
7 Effect of oxidized Al prelayer for the growth of poly-crystalline Al2O3 films on Si using ionized beam deposition
Whangbo SW, Choi YK, Jang HK, Chung YD, Lyo IW, Whang CN
Thin Solid Films, 388(1-2), 290, 2001
8 Effects of SiO2 overlayer at initial growth stage of epitaxial Y2O3 film growth
Cho MH, Ko DH, Choi YG, Lyo IW, Jeong K, Whang CN
Journal of Crystal Growth, 220(4), 501, 2000
9 Effects of chemical etching with sulfuric acid on glass surface
Jang HK, Chung YD, Whangbo SW, Lee YS, Lyo IW, Whang CN, Lee SJ, Kim G
Journal of Vacuum Science & Technology A, 18(2), 401, 2000
10 Titanium oxide films on Si(100) deposited by electron-beam evaporation at 250 degrees C
Jang HK, Whangbo SW, Kim HB, Im KY, Lee YS, Lyo IW, Whang CN, Kim G, Lee HS, Lee JM
Journal of Vacuum Science & Technology A, 18(3), 917, 2000