검색결과 : 3건
No. | Article |
---|---|
1 |
In situ characterization of boron nitride layer growth by polarized FTIR reflection spectroscopy Scheible P, Lunk A Thin Solid Films, 364(1-2), 40, 2000 |
2 |
In situ characterization of cubic boron nitride film growth in the IR spectral region Barth KL, Fukarek W, Maucher HP, Plass MF, Lunk A Thin Solid Films, 313-314, 697, 1998 |
3 |
Deposition of Cubic Boron-Nitride Layers - Characterization of Substrate-Layer Interface Barth KL, Sigle W, Stockle D, Ulmer J, Lunk A Thin Solid Films, 301(1-2), 65, 1997 |