1 |
X-ray reflectivity and FTIR measurements of N-2 plasma effects on the density profile of hydrogen silsesquioxane thin films Lee HJ, Lin EK, Wu WL, Fanconi BM, Lan JK, Cheng YL, Liou HC, Wang YL, Feng MS, Chao CG Journal of the Electrochemical Society, 148(10), F195, 2001 |
2 |
Study the impact of liner thickness on the 0.18 mu m devices using low dielectric constant hydrogen silsesquioxane as the interlayer dielectric Lan JK, Wang YL, Wu YL, Liou HC, Wang JK, Chiu SY, Cheng YL, Feng MS Thin Solid Films, 377-378, 776, 2000 |
3 |
Thickness dependence of the anisotropy in thermal expansion of PMDA-ODA and BPDA-PDA thin films Liou HC, Ho PS, Stierman R Thin Solid Films, 339(1-2), 68, 1999 |
4 |
Structure-property correlation for thin films of semi-interpenetrating polyimide networks. I. Miscibility, curing, and morphology studies Liou HC, Ho PS, Tung B Journal of Applied Polymer Science, 70(2), 261, 1998 |
5 |
Structure-property correlation for thin films of semi-interpenetrating polyimide networks. II. Anisotropy in optical, electrical, thermal, and mechanical properties Liou HC, Ho PS, Tung B Journal of Applied Polymer Science, 70(2), 273, 1998 |
6 |
The effect of crosslinking on thermal and mechanical properties of perfluorocyclobutane aromatic ether polymers Liou HC, Ho PS, McKerrow A Journal of Polymer Science Part B: Polymer Physics, 36(8), 1383, 1998 |
7 |
Study of ultra-thin hydrogen silsesquioxane films using x-ray reflectivity Wu WL, Liou HC Thin Solid Films, 312(1-2), 73, 1998 |
8 |
Study of out-of-plane elastic properties of PMDA-ODA and BPDA-PDA polyimide thin films Liou HC, Willecke R, Ho PS Thin Solid Films, 323(1-2), 203, 1998 |
9 |
Effect of curing temperature on the mechanical properties of hydrogen silsesquioxane thin films Liou HC, Pretzer J Thin Solid Films, 335(1-2), 186, 1998 |