| 1 |
Semiempirical Peak Fitting Guided by ab Initio Calculations of X-ray Photoelectron Spectroscopy Narrow Scans of Chemisorbed, Fluorinated Silanes
Johnson BI, Avval TG, Wheeler J, Anderson HC, Diwan A, Stowers KJ, Ess DH, Linford MR
Langmuir, 36(8), 1878, 2020 |
| 2 |
A perspective on two chemometrics tools: PCA and MCR, and introduction of a new one: Pattern recognition entropy (PRE), as applied to XPS and ToF-SIMS depth profiles of organic and inorganic materials
Chatterjee S, Singh B, Diwan A, Lee ZR, Engelhard MH, Terry J, Tolley HD, Gallagher NB, Linford MR
Applied Surface Science, 433, 994, 2018 |
| 3 |
Low energy ion scattering (LEIS) of as-formed and chemically modified display glass and peak-fitting of the Al/Si LEIS peak envelope
Cushman CV, Bruner P, Zakel J, Dahlquist C, Sturgell B, Grehl T, Lunt BM, Banerjee J, Smith NJ, Linford MR
Applied Surface Science, 455, 18, 2018 |
| 4 |
The Gaussian-Lorentzian Sum, Product, and Convolution (Voigt) functions in the context of peak fitting X-ray photoelectron spectroscopy (XPS) narrow scans
Jain V, Biesinger MC, Linford MR
Applied Surface Science, 447, 548, 2018 |
| 5 |
Performance Comparison of Three Chemical Vapor Deposited Aminosilanes in Peptide Synthesis: Effects of Silane on Peptide Stability and Purity
Saini G, Trenchevska O, Howell LJ, Boyd JG, Smith DP, Jain V, Linford MR
Langmuir, 34(40), 11925, 2018 |
| 6 |
Time-of-flight secondary ion mass spectrometry of wet and dry chemically treated display glass surfaces
Cushman CV, Zakel J, Sturgell BS, Major GI, Lunt BM, Bruner P, Grehl T, Smith NJ, Linford MR
Journal of the American Ceramic Society, 100(10), 4770, 2017 |
| 7 |
Uniqueness plots: A simple graphical tool for identifying poor peak fits in X-ray photoelectron spectroscopy
Singh B, Diwan A, Jain V, Herrera-Gomez A, Terry J, Linford MR
Applied Surface Science, 387, 155, 2016 |
| 8 |
Introduction of thiol moieties, including their thiol-ene reactions and air oxidation, onto polyelectrolyte multilayer substrates
Madaan N, Romriell N, Tuscano J, Schlaad H, Linford MR
Journal of Colloid and Interface Science, 459, 199, 2015 |
| 9 |
Spectroscopic ellipsometric modeling of a Bi-Te-Se write layer of an optical data storage device as guided by atomic force microscopy, scanning electron microscopy, and X-ray diffraction
Wang H, Madaan N, Bagley J, Diwan A, Liu YQ, Davis RC, Lunt BM, Smith SJ, Linford MR
Thin Solid Films, 569, 124, 2014 |
| 10 |
Hydrogen Plasma Treatment of Silicon Dioxide for Improved Silane Deposition
Gupta V, Madaan N, Jensen DS, Kunzler SC, Linford MR
Langmuir, 29(11), 3604, 2013 |
