검색결과 : 10건
No. | Article |
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1 |
Efficiency limiting crystal defects in monocrystalline silicon and their characterization in production Korsos F, Roszol L, Jay F, Veirman J, Draoua AD, Albaric M, Szarvas T, Kiss Z, Szabo A, Soczo I, Nadudvari G, Laurent N Solar Energy Materials and Solar Cells, 186, 217, 2018 |
2 |
Linear smoothing of GaAs(100) during epitaxial growth on rough substrates Whitwick MB, Tiedje T, Li T Journal of Crystal Growth, 310(13), 3192, 2008 |
3 |
Burgers vector analysis by three-dimensional laser-scattering tomography Albrecht M, Naumann M Journal of Crystal Growth, 310(18), 4031, 2008 |
4 |
The effects of Sn4+ ion on the growth habit and optical properties of KDP crystal Wang B, Fang CS, Wang SL, Sun X, Gu QT, Li YP, Xu XG, Zhang JQ, Liu B, Mou XM Journal of Crystal Growth, 297(2), 352, 2006 |
5 |
Octahedral void defects in Czochralski silicon Itsumi M Journal of Crystal Growth, 237, 1773, 2002 |
6 |
Scattering centers caused by adding metaphosphate into KDP crystals Wang SL, Gao ZS, Fu YJ, Sun X, Zhang JG, Zeng H, Li YP Journal of Crystal Growth, 223(3), 415, 2001 |
7 |
Dislocation studies in VCz GaAs by laser scattering tomography Naumann M, Rudolph P, Neubert M, Donecker J Journal of Crystal Growth, 231(1-2), 22, 2001 |
8 |
Striations in YIG fibers grown by the laser-heated pedestal method Lim HJ, DeMattei RC, Feigelson RS, Rochford K Journal of Crystal Growth, 212(1-2), 191, 2000 |
9 |
Defects in flux and Czochralski grown beta-BaB2O4 crystals observed by light scattering tomography Tsuru T, Ogawa T Journal of Crystal Growth, 216(1-4), 352, 2000 |
10 |
Method for Studying the Grown-in Defect Density Spectra in Czochralski Silicon-Wafers Kissinger G, Graf D, Lambert U, Richter H Journal of the Electrochemical Society, 144(4), 1447, 1997 |