화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Benchmarking stencil reticles for electron projection lithography
Wood OR, Trybula WJ, Lercel MJ, Thiel CW, Lawliss MJ, Edinger K, Stanishevsky A, Shimizu S, Kawata S
Journal of Vacuum Science & Technology B, 21(6), 3072, 2003
2 Simulating the effects of pattern density gradients on electron-beam projection lithography pattern transfer distortions
Reu PL, Engelstad RL, Lovell EG, Magg CK, Lercel MJ, Mackay RS
Journal of Vacuum Science & Technology B, 19(6), 2652, 2001
3 Role of gas feed delivery and dilutent on oxide etching in an inductively coupled plasma etch system
Lercel MJ, Dang D, Marmillion N, Mlynko W
Journal of Vacuum Science & Technology A, 16(3), 1459, 1998
4 Etching processes and characteristics for the fabrication of refractory x-ray masks
Lercel MJ, Brooks CJ, Benoit DE, Surendra M
Journal of Vacuum Science & Technology B, 16(6), 3577, 1998
5 High-Selectivity Pattern Transfer Processes for Self-Assembled Monolayer Electron-Beam Resists
Carr DW, Lercel MJ, Whelan CS, Craighead HG, Seshadri K, Allara DL
Journal of Vacuum Science & Technology A, 15(3), 1446, 1997
6 Electron-Beam-Induced Damage in Self-Assembled Monolayers
Seshadri K, Froyd K, Parikh AN, Allara DL, Lercel MJ, Craighead HG
Journal of Physical Chemistry, 100(39), 15900, 1996
7 Plasma-Etching with Self-Assembled Monolayer Masks for Nanostructure Fabrication
Lercel MJ, Craighead HG, Parikh AN, Seshadri K, Allara DL
Journal of Vacuum Science & Technology A, 14(3), 1844, 1996
8 High-Resolution Silicon Patterning with Self-Assembled Monolayer Resists
Lercel MJ, Whelan CS, Craighead HG, Seshadri K, Allara DL
Journal of Vacuum Science & Technology B, 14(6), 4085, 1996
9 Pattern Transfer of Electron-Beam Modified Self-Assembled Monolayers for High-Resolution Lithography
Lercel MJ, Rooks M, Tiberio RC, Craighead HG, Sheen CW, Parikh AN, Allara DL
Journal of Vacuum Science & Technology B, 13(3), 1139, 1995
10 Electron-Beam Lithography with Monolayers of Alkylthiols and Alkylsiloxanes
Lercel MJ, Redinbo GF, Pardo FD, Rooks M, Tiberio RC, Simpson P, Craighead HG, Sheen CW, Parikh AN, Allara DL
Journal of Vacuum Science & Technology B, 12(6), 3663, 1994