검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Roughness Analysis of Si/SiGe Heterostructures Feenstra RM, Lutz MA, Stern F, Ismail K, Mooney PM, Legoues FK, Stanis C, Chu JO, Meyerson BS Journal of Vacuum Science & Technology B, 13(4), 1608, 1995 |
| 2 |
Strain Relaxation in Ultrathin Epitaxial-Films of Beta-Fesi2 on Unstrained and Strained Si(100) Surfaces Peale DR, Haight R, Legoues FK Thin Solid Films, 264(1), 28, 1995 |