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| No. | Article |
|---|---|
| 1 |
Accurate Profiling of Ultra-Shallow Implants with Mercury Gate Metal-Oxide-Semiconductor Capacitance-Voltage Ledudal R, Hillard RJ, Heddleson JM, Weinzierl SR, Raichoudhury P, Mazur RG Journal of Vacuum Science & Technology B, 12(1), 336, 1994 |