검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Initial estimation of thin film thickness measurement based on white light spectral interferometry Guo T, Wu JH, Ni LF, Fu X, Hu XT Thin Solid Films, 612, 267, 2016 |
| 2 |
A fast cross-validation method for alignment of electron tomography images based on Beer-Lambert law Yan R, Edwards TJ, Pankratz LM, Kuhn RJ, Lanman JK, Liu J, Jiang W Journal of Structural Biology, 192(2), 297, 2015 |
| 3 |
Modeling and forecasting monthly movement of annual average solar insolation based on the least-squares Fourier-model Yang ZC Energy Conversion and Management, 81, 201, 2014 |
| 4 |
The influence of errors of X-ray texture measurements on ODF calculation with central normal distribution approximation Ivanova TM, Lubman HU, Savyolova TI, Serebryany VN Materials Science Forum, 495-497, 273, 2005 |