| 1 |
Chemistry of surface nanostructures in lead precursor-rich PbZr0.52Ti0.48O3 sol-gel films
Gueye I, Le Rhun G, Gergaud P, Renault O, Defay E, Barrett N
Applied Surface Science, 363, 21, 2016 |
| 2 |
Pyroelectricity of Pb(Zr0.52Ti0.48)O-3 films grown by sol-gel process on silicon
Moalla R, Le Rhun G, Defay E, Baboux N, Sebald G, Bachelet R
Thin Solid Films, 601, 80, 2016 |
| 3 |
Comparison between the ferroelectric/electric properties of the PbZr0.52Ti0.48O3 films grown on Si (100) and on STO (100) substrates
Chirila C, Boni AG, Pasuk I, Negrea R, Trupina L, Le Rhun G, Yin S, Vilquin B, Pintilie I, Pintilie L
Journal of Materials Science, 50(11), 3883, 2015 |
| 4 |
Electrode interface controlled electrical properties in epitaxial Pb(Zr0.52Ti0.48)O-3 films grown on Si substrates with SrTiO3 buffer layer
Boni AG, Chirila C, Pasuk I, Negrea R, Trupina L, Le Rhun G, Vilquin B, Pintilie I, Pintilie L
Thin Solid Films, 593, 124, 2015 |
| 5 |
Epitaxial growth and electrical measurement of single crystalline Pb(Zr0.52Ti0.48)O-3 thin film on Si(001) for micro-electromechanical systems
Yin S, Niu G, Vilquin B, Gautier B, Le Rhun G, Defay E, Robach Y
Thin Solid Films, 520(14), 4572, 2012 |
| 6 |
Intrinsic ferroelectric properties of strained tetragonal PbZr0.2Ti0.8O3 obtained on layer-by-layer grown, defect-free single-crystalline films
Vrejoiu I, Le Rhun G, Pintilie L, Hesse D, Alexe M, Goesele U
Advanced Materials, 18(13), 1657, 2006 |
| 7 |
Restoration of polarization in ferroelectric thin films studied with the model of trapping of carriers at interfacial states
Poullain G, Le Rhun G, Bouregba R
Thin Solid Films, 515(4), 1835, 2006 |
| 8 |
Effect of in situ Pt bottom electrode deposition and of Pt top electrode preparation on PZT thin films properties
Vilquin B, Le Rhun G, Bouregba R, Poullain G, Murray H
Applied Surface Science, 195(1-4), 63, 2002 |
